Microstructural Characterization of Materials
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Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.
Microstructural Characterization of Materials, 2nd Edition is an introduction to the experti…
Microstructural Characterization of Materials, 2nd Edition is an introduction to the experti…
Categories
Science & TechnologyNonfictionEngineeringElectrical & Electronic EngineeringIndustrial Engineering & Materials SciencePhysicsApplied ScienceElectronics - MicroelectronicsElectronics - SemiconductorsMaterials Science - General & MiscellaneousSolid State Physics - General & MiscellaneousMicroscopes & Microscopy - General & Miscellaneous



