Cluster Secondary Ion Mass Spectrometry: Principles and Applications
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Explores the impact of the latest breakthroughs in cluster SIMS technology
Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability…


















